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Volumn 405, Issue 1, 2010, Pages 262-267

Influence of epitaxial growth orientation on residual strain and dielectric properties of (Ba0.3Sr0.7)TiO3 films grown on in-plane compressive substrates

Author keywords

Epitaxial films; Ferroelectrics; Growth orientation; Phase transition; Strain

Indexed keywords

CURIE-WEISS TEMPERATURE; FERROELECTRICS; GROWTH ORIENTATION; GROWTH ORIENTATIONS; IN-PLANE; IN-PLANE COMPRESSIVE STRAIN; ORIENTATION DEPENDENCE; RESIDUAL STRAINS; RF-MAGNETRON SPUTTERING; SRTIO; TIO;

EID: 79955684422     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150193.2010.483391     Document Type: Conference Paper
Times cited : (4)

References (6)
  • 6
    • 0036607423 scopus 로고    scopus 로고
    • Phase diagrams and dielectric response of epitaxial barium strontium titanate films: A theoretical analysis
    • DOI 10.1063/1.1473675
    • Z. G. Ban and S. P. Alpay, Phase diagrams and dielectric response of epitaxial barium strontium titanate films: A theoretical analysis. J. Appl. Phys. 91, 9288 (2002). (Pubitemid 34638054)
    • (2002) Journal of Applied Physics , vol.91 , Issue.11 , pp. 9288
    • Ban, Z.-G.1    Alpay, S.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.