Real-time terahertz near-field microscope

Optics Express

Volumn 19, Issue 9, 2011, Pages 8277-8284

  Blanchard, F ^a,b   Doi, A ^b,c   Tanaka, T ^a,b   Hirori, H ^a,b   Tanaka, H ^b,d   Kadoya, Y ^b,d   Tanaka, K ^a,b,e  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c OLYMPUS CORPORATION   (Japan)

^d HIROSHIMA UNIVERSITY   (Japan)

^e KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

A-CENTER; CAPTURE IMAGES; ELECTRO-OPTICS; FIELD ENHANCEMENT; FRAMES PER SECONDS; HIGH DYNAMIC RANGE; HIGH SPATIAL RESOLUTION; NEAR-FIELD; NOVEL TECHNIQUES; TERA HERTZ; TERAHERTZ GENERATION; TERAHERTZ PULSE; THIN CRYSTAL;

MICROSCOPES;

ARTICLE; COMPUTER SYSTEM; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TERAHERTZ IMAGING;

COMPUTER SYSTEMS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TERAHERTZ IMAGING;

EID: 79955458489     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.008277     Document Type: Article

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