Tip bluntness transition measured with atomic force microscopy and the effect on hardness variation with depth in silicon dioxide nanoindentation

International Journal of Precision Engineering and Manufacturing

Volumn 12, Issue 2, 2011, Pages 345-354

  Choi, Joo Hoon ^a   Korach, Chad Steven ^a  

^a Stony Brook University   (United States)

Author keywords

Atomic force microscopy; Diamond area function; Hardness; Nanoindentation

Indexed keywords

EID: 79955447320     PISSN: 12298557     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12541-011-0045-4     Document Type: Article

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