Dealing with imperfection: Quantifying potential length scale artefacts from nominally spherical indenter probes

Nanotechnology

Volumn 18, Issue 30, 2007, Pages

  Constantinides, G ^a   Silva, E C C M ^a   Blackman, G S ^b   Van Vliet, K J ^a  

^a USA   (United States)

^b DUPONT COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; ELASTIC CONSTANTS; PROBES; QUARTZ; SCANNING ELECTRON MICROSCOPY;

ANALYTICAL INTERPRETATION; EXPERIMENTAL RESPONSE; LOAD-DEPTH RESPONSES;

NANOINDENTATION;

ARTICLE; ERROR; METHODOLOGY; MOLECULAR PROBE; PRIORITY JOURNAL; SPHERICAL INDENTER PROBE;

EID: 34547173689     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/30/305503     Document Type: Article

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