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Volumn 133, Issue 17, 2011, Pages 6711-6719

Colloidal gallium indium oxide nanocrystals: A multifunctional light-emitting phosphor broadly tunable by Alloy composition

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY COMPOSITIONS; COLLOIDAL METHODS; COMPOSITION RANGES; COMPOSITIONAL DEPENDENCE; DEFECT SITES; DONOR-ACCEPTOR PAIRS; ELECTRON DONORS; EMISSION DECAYS; ENERGY STATE; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; FUNCTIONAL PROPERTIES; HOST LATTICE; INDIUM CONTENT; INDIUM OXIDE; LIGHT-EMITTING PHOSPHORS; NANOCRYSTAL STRUCTURES; OXYGEN VACANCY DEFECTS; PHOTOLUMINESCENCE PROPERTIES; ROOM TEMPERATURE; SPECTROSCOPIC METHOD; SPINEL-TYPE; SUBSTITUTIONAL INCORPORATION; TRANSPARENT CONDUCTING OXIDE; TUNABILITIES; VISIBLE SPECTRAL RANGE;

EID: 79955447197     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja111514u     Document Type: Article
Times cited : (79)

References (53)
  • 36
    • 79955429839 scopus 로고    scopus 로고
    • This program can be downloaded from.
    • This program can be downloaded from http://leonardo.phys.washington.edu/ feff/.
  • 49
    • 79955431374 scopus 로고    scopus 로고
    • Although the error bars associated with EXAFS analysis are sizable, the dependence of the In-O bond distance on the In concentration in GIO NCs is very unlikely to be linear, given the comparison of EXAFS with XRD and PL results for the same samples. The linear dependence of the In-O bond distance on the In concentration in GIO NCs would indicate continuous mixing of In and Ga in a single phase, which is not supported by XRD patterns and PL shifts for high In concentrations.
    • Although the error bars associated with EXAFS analysis are sizable, the dependence of the In-O bond distance on the In concentration in GIO NCs is very unlikely to be linear, given the comparison of EXAFS with XRD and PL results for the same samples. The linear dependence of the In-O bond distance on the In concentration in GIO NCs would indicate continuous mixing of In and Ga in a single phase, which is not supported by XRD patterns and PL shifts for high In concentrations.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.