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Volumn 113, Issue 36, 2009, Pages 15928-15933

Dopant-induced manipulation of the growth and structural metastability of colloidal indium oxide nanocrystals

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC VOLUMES; CRITICAL SIZE; DOPANT INCORPORATION; DOPING MECHANISM; DOPING SEMICONDUCTORS; FUNCTIONAL PROPERTIES; INDIUM OXIDE; MULTIFUNCTIONAL NANOSTRUCTURES; NANOCRYSTAL GROWTH; NANOCRYSTAL STRUCTURES; NEW APPROACHES; PHASE TRANSFORMATION; STRUCTURAL METASTABILITY; SURFACE STRESS;

EID: 70349113807     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp905281k     Document Type: Article
Times cited : (70)

References (44)
  • 22
    • 70349103529 scopus 로고    scopus 로고
    • 3
    • 3.
  • 24
    • 70349099793 scopus 로고    scopus 로고
    • Elemental line scan profiles were simulated on the basis of morphologies of the analyzed nanocrystals. For the reported simulations in Figure 5c, the model was designed to represent the square cross-section geometry and "non-tilted" orientation of the NC two parallel sides oriented perpendicular to the electron beam, corresponding to NC in Figure 5c, inset. The intensity at each point was modeled as the sum of intensity contributions from all points to the intensity at that particular point due to electron beam broadening. The broadening factor was determined on the basis of the Gaussian electron probe profile of 2.5 nm full width at half maximum FWHM
    • Elemental line scan profiles were simulated on the basis of morphologies of the analyzed nanocrystals. For the reported simulations in Figure 5c, the model was designed to represent the square cross-section geometry and "non-tilted" orientation of the NC (two parallel sides oriented perpendicular to the electron beam), corresponding to NC in Figure 5c, inset. The intensity at each point was modeled as the sum of intensity contributions from all points to the intensity at that particular point due to electron beam broadening. The broadening factor was determined on the basis of the Gaussian electron probe profile of 2.5 nm full width at half maximum (FWHM).
  • 25
    • 70349143370 scopus 로고    scopus 로고
    • 3 before the NC phase transformation. Given the final size of the NC in Figure 5c, inset ca. 15 nm the relative contribution to the EDX signal from the core is very small and cannot be detected in the line scan
    • 3 before the NC phase transformation. Given the final size of the NC in Figure 5c, inset (ca. 15 nm) the relative contribution to the EDX signal from the core is very small and cannot be detected in the line scan.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.