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Elemental line scan profiles were simulated on the basis of morphologies of the analyzed nanocrystals. For the reported simulations in Figure 5c, the model was designed to represent the square cross-section geometry and "non-tilted" orientation of the NC two parallel sides oriented perpendicular to the electron beam, corresponding to NC in Figure 5c, inset. The intensity at each point was modeled as the sum of intensity contributions from all points to the intensity at that particular point due to electron beam broadening. The broadening factor was determined on the basis of the Gaussian electron probe profile of 2.5 nm full width at half maximum FWHM
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Elemental line scan profiles were simulated on the basis of morphologies of the analyzed nanocrystals. For the reported simulations in Figure 5c, the model was designed to represent the square cross-section geometry and "non-tilted" orientation of the NC (two parallel sides oriented perpendicular to the electron beam), corresponding to NC in Figure 5c, inset. The intensity at each point was modeled as the sum of intensity contributions from all points to the intensity at that particular point due to electron beam broadening. The broadening factor was determined on the basis of the Gaussian electron probe profile of 2.5 nm full width at half maximum (FWHM).
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3 before the NC phase transformation. Given the final size of the NC in Figure 5c, inset ca. 15 nm the relative contribution to the EDX signal from the core is very small and cannot be detected in the line scan
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3 before the NC phase transformation. Given the final size of the NC in Figure 5c, inset (ca. 15 nm) the relative contribution to the EDX signal from the core is very small and cannot be detected in the line scan.
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