Analysis and engineering of chromatic dispersion in silicon waveguide bends and ring resonators

Optics Express

Volumn 19, Issue 9, 2011, Pages 8102-8107

  Zhang, Lin ^a   Yue, Yang ^a   Beausoleil, Raymond G ^b   Willner, Alan E ^a  

^a Department of Electrical Engineering University of Southern California ^*  (United States)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMATIC DISPERSION; DISPERSIONS; OPTICAL PARAMETRIC OSCILLATORS; RESONATORS; SPECTROSCOPY; WAVEGUIDES;

BENDING RADIUS; CRITICAL ISSUES; DESIGN AND OPTIMIZATION; DISPERSION PROFILE; FREE SPECTRAL RANGE; FREQUENCY COMBS; FREQUENCY-DEPENDENT; HIGH INDEX CONTRAST; MICRO RESONATORS; MID-INFRARED WAVELENGTH RANGES; NONLINEAR APPLICATIONS; ON CHIPS; POLARIZATION STATE; RING RESONATOR; SILICON STRIP; SILICON WAVEGUIDE; SLOT STRUCTURES; SLOT WAVEGUIDE; SPECTRAL LINE; STANDARD DEVIATION; WAVEGUIDE RESONATORS; ZERO-DISPERSION WAVELENGTH;

DISPERSION (WAVES);

SILICON;

ARTICLE; CHEMISTRY; COMPUTER SIMULATION; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LIGHT; OPTICAL INSTRUMENTATION; RADIATION SCATTERING; REFRACTOMETRY; THEORETICAL MODEL; TRANSDUCER;

COMPUTER SIMULATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LIGHT; MODELS, THEORETICAL; OPTICAL DEVICES; REFRACTOMETRY; SCATTERING, RADIATION; SILICON; TRANSDUCERS;

EID: 79955379882     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.008102     Document Type: Article

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