X-ray fluorescence - Analysis of 19th century stamps

X-Ray Spectrometry

Volumn 37, Issue 3, 2008, Pages 260-264

  Cesareo, Roberto ^a,b   Brunetti, Antonio ^a  

^a Istituto di Matematica e Fisica   (Italy)

^b UNIVERSITY OF SASSARI   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; SILICON COMPOUNDS; X RAY TUBES;

19TH CENTURY; INORGANIC COMPONENTS; LATIN AMERICANS; PIN DETECTOR; PORTABLE X-RAY FLUORESCENCE; X RAY FLUORESCENCE ANALYSIS;

X RAY DETECTORS;

EID: 44949183801     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1011     Document Type: Article

References (6)

1. EDAX Inc., 91 McKee Drive, Mahwah, NJ 07430 USA ; www.edax.com/ technology/microXRF/forensic/ink.analysis.html.
2. AMPTEK Inc., 6 De Angelo Drive, Bedford, MA 01730-2204 USA; www.amptek.com.
3. Institut für Gerätebau GmbH, Rudower Chaussee 5, 12489 Berlin, Germany; www.ifg-adlershof.de.
4. Seccaroni C, Moioli P. Prontuario per l'analisi XRF Portatile Applicata a Superfici Policrome. Nardini Editore: Firenze, 2002.
5. Rindby A, Adams F, Engstrom P. Microfocusing X-ray Optics. In Microscopic X-ray Fluorescence Analysis, Janssens K, Adams F, Rindby A (eds). John Wiley and Sons: Chichester, New York, Weinheim, Brisbane, Toronto, Singapore, 2000; 63, Janssens K, Vincze L, Vekemans B. Evaluation and calibration of μ-XRF data, Ibidem 155, Janssens K, Adams F. Applications in Art and Archaeology, Ibidem 291.
6. Chaplin TD, Jurado-Lopez A, Clark RJH, Beech DR. J. Raman Spectrosc. 2004; 35-7: 600.