The new Maia detector system: Methods for high definition trace element imaging of natural material

AIP Conference Proceedings

Volumn 1221, Issue , 2010, Pages 9-17

  Ryan, C G ^a,d,e   Siddons, D P ^b   Kirkham, R ^a   Dunn, P A ^a   Kuczewski, A ^b   Moorhead, G ^a,d   De Geronimo, G ^b   Paterson, D J ^c   De Jonge, M D ^c   Hough, R M ^a   Lintern, M J ^a   Howard, D L ^c   Kappen, P ^f   Cleverley, J ^a  

^a CSIRO   (Australia)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c AUSTRALIAN SYNCHROTRON   (Australia)

^d UNIVERSITY OF MELBOURNE   (Australia)

^e UNIVERSITY OF TASMANIA   (Australia)

^f LA TROBE UNIVERSITY   (Australia)

Author keywords

Dynamic analysis; Real time processing; Silicon detector; SXRF; Trace element imaging; X ray microprobe

Indexed keywords

EID: 77957980472     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3399266     Document Type: Conference Paper

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