Surface adsorbate fluctuations and noise in nanoelectromechanical systems

Nano Letters

Volumn 11, Issue 4, 2011, Pages 1753-1759

  Yang, Y T ^a,b   Callegari, C ^a,c   Feng, X L ^a,d   Roukes, M L ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c SINCROTRONE TRIESTE   (Italy)

^d Case Western Reserve University   (United States)

Author keywords

adsorption desorption; diffusion; Nanoelectromechanical systems (NEMS); noise; resonator; surface adsorbate

Indexed keywords

ADSORPTION DESORPTION; ADSORPTION SPECTRUM; ADSORPTION-DESORPTION PROCESS; ANALYTIC MODELING; ELECTROMECHANICAL RESONATORS; EXCESS NOISE; FREQUENCY NOISE; FREQUENCY SHIFT; HIGH QUALITY FACTORS; MASS SENSITIVITY; NANO ELECTROMECHANICAL SYSTEMS; NANO-SCALE SYSTEM; NANOELECTROMECHANICAL SYSTEMS (NEMS); NOISE; PHYSISORBED; POWER LAW; PROBE SURFACE; RESONANCE FREQUENCIES; SINGLE MOLECULE LEVEL; SOLID SURFACE; SURFACE ADSORBATE; SURFACE ADSORBATES;

DESORPTION; DIFFUSION; NEMS; PHYSISORPTION; RESONANCE; RESONATORS;

ADSORBATES;

NANOMATERIAL; XENON;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MICROELECTROMECHANICAL SYSTEM; NANOTECHNOLOGY; ULTRASTRUCTURE;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICRO-ELECTRICAL-MECHANICAL SYSTEMS; NANOSTRUCTURES; NANOTECHNOLOGY; XENON;

EID: 79954553569     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl2003158     Document Type: Article

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