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Volumn 84, Issue 22, 2004, Pages 4442-4444
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Structure of grain boundaries in nanostructured ZnO
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
DIFFRACTOMETERS;
FOURIER TRANSFORMS;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
ITERATIVE METHODS;
MOLECULAR BEAM EPITAXY;
OSCILLATIONS;
PARAMETER ESTIMATION;
POLYCRYSTALLINE MATERIALS;
SUBSTRATES;
TRANSMISSION ELECTRON MICROSCOPY;
VOLUME FRACTION;
X RAY DIFFRACTION;
X RAY SCATTERING;
ZINC OXIDE;
DEIONIZED WATER;
INVERSE TRANSFORMS;
RADIAL DISTRIBUTION FUNCTIONS;
X-RAY ABSORPTION FINE STRUCTURE (XAFS);
NANOSTRUCTURED MATERIALS;
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EID: 3042781664
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1759060 Document Type: Article |
Times cited : (25)
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References (18)
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