Electronic structure of ZnO nanorods studied by angle-dependent X-ray absorption spectroscopy and scanning photoelectron microscopy

Applied Physics Letters

Volumn 84, Issue 18, 2004, Pages 3462-3464

  Chiou, J W ^a   Jan, J C ^a   Tsai, H M ^a   Bao, C W ^a   Pong, W F ^a   Tsai, M H ^b   Hong, I H ^c,e   Klauser, R ^c   Lee, J F ^c   Wu, J J ^d   Liu, S C ^d  

^a TAMKANG UNIVERSITY   (Taiwan)

^b NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^d NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^e NATIONAL CHIAYI UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CATALYSIS; CHEMICAL VAPOR DEPOSITION; NANOSTRUCTURED MATERIALS; OPTOELECTRONIC DEVICES; PHOTOELECTRON SPECTROSCOPY; PHOTONS; POLARIZATION; SEMICONDUCTING ZINC COMPOUNDS; X RAY SPECTROSCOPY;

CONDUCTION BANDS; NANORODS; NANOSCALE MATERIALS; SCANNING PHOTOELECTRON MICROSCOPY;

ELECTRONIC STRUCTURE;

EID: 2542467876     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1737075     Document Type: Article

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