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Volumn 44, Issue 5, 2011, Pages 988-993

A virtual machine-based uncertainty evaluation for a traceable areal surface texture measuring instrument

Author keywords

Areal surface texture; GUM; Interferometry; Monte Carlo simulation; Surface texture measurement; Traceability; Uncertainty

Indexed keywords

GUM; MONTE CARLO SIMULATION; SURFACE TEXTURE MEASUREMENT; SURFACE TEXTURES; TRACEABILITY; UNCERTAINTY;

EID: 79953785776     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2011.02.011     Document Type: Article
Times cited : (37)

References (13)
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    • R.K. Leach, C.L. Giusca, and K. Naoi Development and characterisation of a new instrument for the traceable measurement of areal surface texture Meas. Sci. Technol. 20 2009 125102
    • (2009) Meas. Sci. Technol. , vol.20 , pp. 125102
    • Leach, R.K.1    Giusca, C.L.2    Naoi, K.3
  • 2
    • 0033323243 scopus 로고    scopus 로고
    • Structured textured or engineered surfaces
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    • (1999) Ann. CIRP , vol.48 , Issue.2 , pp. 541-556
    • Evans, C.J.1    Bryan, J.B.2
  • 3
    • 55949092598 scopus 로고    scopus 로고
    • Advances in engineering surfaces for functional performance
    • A.A.G. Bruzzone, H.L. Costa, P.M. Leonardo, and D.A. Lucca Advances in engineering surfaces for functional performance Ann. CIRP 57 2008 750 769
    • (2008) Ann. CIRP , vol.57 , pp. 750-769
    • Bruzzone, A.A.G.1    Costa, H.L.2    Leonardo, P.M.3    Lucca, D.A.4
  • 5
    • 79953780870 scopus 로고    scopus 로고
    • BIPM, IEC, IFCC, ILAC, ISO, IUPAC, IUPAP, OIML, Evaluation of Measurement Data - Supplement 1 to the "Guide to the Expression of Uncertainty in Measurement - Propagation of Distributions Using a Monte Carlo Method, Bureau International des Poids et Mesures, JCGM 101
    • BIPM, IEC, IFCC, ILAC, ISO, IUPAC, IUPAP, OIML, Evaluation of Measurement Data - Supplement 1 to the "Guide to the Expression of Uncertainty in Measurement - Propagation of Distributions Using a Monte Carlo Method, Bureau International des Poids et Mesures, JCGM 101, 2008.
    • (2008)
  • 7
    • 0032164170 scopus 로고    scopus 로고
    • Verification of the sub-nanometric capability of an NPL differential plane mirror interferometer with a capacitance probe
    • M.J. Downs, and J.W. Nunn Verification of the sub-nanometric capability of an NPL differential plane mirror interferometer with a capacitance probe Meas. Sci. Technol. 9 1998 1437 1440
    • (1998) Meas. Sci. Technol. , vol.9 , pp. 1437-1440
    • Downs, M.J.1    Nunn, J.W.2
  • 10
    • 79953780689 scopus 로고    scopus 로고
    • BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, Guide to the Expression of Uncertainty in Measurement, Bureau International des Poids et Mesures, JCGM 100
    • BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, Guide to the Expression of Uncertainty in Measurement, Bureau International des Poids et Mesures, JCGM 100, 2008.
    • (2008)
  • 12
    • 0034246242 scopus 로고    scopus 로고
    • Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV
    • R.K. Leach Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV Meas. Sci. Technol. 11 2000 1162 1173
    • (2000) Meas. Sci. Technol. , vol.11 , pp. 1162-1173
    • Leach, R.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.