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Volumn 274, Issue 1, 2011, Pages
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Determination of the optical bandgap and disorder energies of thin amorphous SiC and AlN films produced by radio frequency magnetron sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM NITRIDE;
AMORPHOUS FILMS;
ENERGY GAP;
LIGHT TRANSMISSION;
MAGNETRON SPUTTERING;
OPTICAL BAND GAPS;
RADIO WAVES;
SILICON CARBIDE;
THIN FILMS;
DEPOSITED FILMS;
DEPOSITION METHODS;
DETERMINATION METHODS;
DISORDER ENERGY;
LINEAR RELATION;
OPTICAL TRANSMISSION SPECTROSCOPY;
RADIO FREQUENCY MAGNETRON SPUTTERING;
THERMAL-ANNEALING;
AMORPHOUS SILICON;
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EID: 79953752042
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/274/1/012113 Document Type: Conference Paper |
Times cited : (9)
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References (18)
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