Organic thin-film transistors: Part II-parameter extraction

IEEE Transactions on Electron Devices

Volumn 56, Issue 12, 2009, Pages 2962-2968

  Deen, M Jamal ^a   Marinov, Ognian ^a   Zschieschang, Ute ^b   Klauk, Hagen ^b  

^a MCMASTER UNIVERSITY   (Canada)

^b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

Compact modeling; Experimental characterization and symmetric models for thin film transistor (TFT); Organic TFTs (OTFTs); Polymeric TFTs (PTFTs)

Indexed keywords

CHARACTERIZATION TECHNIQUES; CIRCUIT SIMULATORS; COMPACT MODELING; DC MODEL; ORGANIC TFTS; ORGANIC THIN FILM TRANSISTORS; POLYMERIC TFTS (PTFTS); SUBTHRESHOLD; SYMMETRIC MODEL; THIN FILM TRANSISTORS (TFT);

PARAMETER EXTRACTION; THIN FILM TRANSISTORS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 79953659135     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2009.2033309     Document Type: Article

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