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Volumn A, Issue , 2003, Pages 71-74
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Determination of the surface recombination velocity of unpassivated silicon from spectral photoconductance measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
PHOTOCONDUCTANCE;
SURFACE DAMAGE;
SURFACE RECOMBINATION;
BOUNDARY CONDITIONS;
FUNCTIONS;
OPTIMIZATION;
PHOTOCONDUCTIVITY;
PHOTONS;
QUANTUM EFFICIENCY;
SEMICONDUCTOR JUNCTIONS;
SURFACE PHENOMENA;
SILICON WAFERS;
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EID: 6344262075
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (30)
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References (13)
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