Microstructural changes induced by low energy heavy ion irradiation in titanium silicon carbide

Journal of the European Ceramic Society

Volumn 31, Issue 8, 2011, Pages 1503-1511

  Nappe J C ^a   Maurice, C ^b   Grosseau, Ph ^a   Audubert, F ^c   Thome L ^d   Guilhot, B ^a   Beauvy, M ^c   Benabdesselam, M ^e  

^a ECOLE DES MINES DE SAINT ETIENNE   (France)

^b LCG   (France)

^c IRFM   (France)

^d CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^e UNIVERSITÉ CÔTE D'AZUR   (France)

Author keywords

25.75.Ag; 28.41.Bm; 61.05.J ; 61.80.Lj; 68.37.Ps; 81.05.Je; Anisotropic swelling; Atomic force microscopy; Electron back scatter diffraction; Nuclear interaction

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; BACKSCATTERING; DIFFRACTION; HEAVY IONS; SILICON CARBIDE; SWELLING;

25.75.AG; 28.41.BM; 61.05.J; 61.80.LJ; 68.37.PS; 81.05.JE; ANISOTROPIC SWELLING; ELECTRON BACK SCATTER DIFFRACTION; NUCLEAR INTERACTION;

ION BOMBARDMENT;

EID: 79953312437     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2011.01.002     Document Type: Article

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