Irradiation damage in Ti3(Si,Al)C2: A TEM investigation

International Journal of Applied Ceramic Technology

Volumn 7, Issue 6, 2010, Pages 766-775

  Le Flem, Marion ^a   Liu, Xingmin ^a   Doriot, Sylvie ^a   Cozzika, Théodore ^a   Monnet, Isabelle ^b  

^a CEA SACLAY   (France)

^b CNRS UMR 3299   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC DISORDER; BASAL PLANES; CANDIDATE MATERIALS; CORE COMPONENTS; DIFFRACTION SPOTS; ELECTRICAL PROPERTY; GAS-COOLED; IRRADIATION DAMAGE; MAX PHASIS; MECHANICAL BEHAVIOR; MICROSTRUCTURE CHANGES; NANOINDENTATION ANALYSIS; ROOM TEMPERATURE; TARGET TEMPERATURE; TEM;

ALUMINUM; AMORPHOUS MATERIALS; CORROSION RESISTANCE; DIFFRACTION; ELECTRIC PROPERTIES; IRRADIATION; MECHANICAL PROPERTIES; NANOINDENTATION; NUCLEAR PROPULSION; NUCLEAR REACTORS; SILICON; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; XENON;

X RAY DIFFRACTION ANALYSIS;

EID: 78449275376     PISSN: 1546542X     EISSN: 17447402     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2010.02523.x     Document Type: Article

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