Utilizing boron nitride sheets as thin supports for high resolution imaging of nanocrystals

Nanotechnology

Volumn 22, Issue 19, 2011, Pages

  Wu, Yimin A ^a   Kirkland, Angus I ^a   Schäffel, Franziska ^a   Porfyrakis, Kyriakos ^a   Young, Neil P ^a   Briggs, G Andrew D ^a   Warner, Jamie H ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

2-D CRYSTALS; ATOMIC STRUCTURE; GENERIC APPROACH; HIGH-RESOLUTION IMAGING; LATTICE PLANE; LOW VOLTAGES; MN-DOPED; PHASE-CONTRAST IMAGE; RELATIVE ORIENTATION;

BORON; CRYSTAL ATOMIC STRUCTURE; GRAPHENE; MANGANESE; NANOCRYSTALS; NITRIDES;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

BORON; BORON DERIVATIVE; ELBOR; GRAPHITE; MANGANESE; NANOPARTICLE; NITROGEN; OXIDE; SELENIUM; SELENIUM DERIVATIVE; ZINC; ZINC DERIVATIVE; ZINC SELENIDE;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; STATISTICAL MODEL; TRANSMISSION ELECTRON MICROSCOPY;

BORON; BORON COMPOUNDS; CRYSTALLIZATION; GRAPHITE; MANGANESE; MATERIALS TESTING; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, STATISTICAL; NANOPARTICLES; NANOTECHNOLOGY; NITROGEN; OXIDES; SELENIUM; SELENIUM COMPOUNDS; ZINC; ZINC COMPOUNDS;

EID: 79953278051     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/19/195603     Document Type: Article

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