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Volumn 11, Issue 1 SUPPL., 2011, Pages
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Study of nanocrystalline ceria thin films deposited by e-beam technique
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Author keywords
CeO2; Nanocrystalline; Raman spectra; Refractive index; Thin films
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Indexed keywords
CEO2;
CERIA FILMS;
CERIA THIN FILMS;
ELECTRON BEAM EVAPORATION METHODS;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
GLASS SUBSTRATES;
HIGH TRANSPARENCY;
NANOCRYSTALLINES;
POWER INCREASE;
RAMAN SPECTRA;
ROOM TEMPERATURE;
SEM IMAGE;
SUBSTRATE TEMPERATURE;
UV VISIBLE SPECTROSCOPY;
UV-VISIBLE;
VISIBLE REGION;
CERIUM COMPOUNDS;
CRYSTALLITE SIZE;
ELECTRON BEAMS;
ELECTRON GUNS;
ELECTRONS;
FIELD EMISSION;
FIELD EMISSION MICROSCOPES;
LIGHT REFRACTION;
OXYGEN;
OXYGEN VACANCIES;
PLASMA GUNS;
RAMAN SPECTROSCOPY;
REFRACTIVE INDEX;
REFRACTOMETERS;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
THIN FILMS;
ULTRAVIOLET SPECTROSCOPY;
X RAY DIFFRACTION;
RAMAN SCATTERING;
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EID: 79953180514
PISSN: 15671739
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cap.2010.11.053 Document Type: Conference Paper |
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Times cited : (32)
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References (23)
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