Determination of the photocarrier diffusion length in intrinsic Ge nanowires

Optics Express

Volumn 19, Issue 7, 2011, Pages 6119-6124

  Shin, Yun Sok ^a   Lee, Donghun ^a   Lee, Hyun Seung ^a   Cho, Yong Jun ^a   Kim, Cheol Joo ^a   Jo, Moon Ho ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; NANOWIRES; PHOTOELECTRICITY;

DIFFUSION LENGTH; DIFFUSION RATE; FINITE BIAS; PHOTOCARRIER; PHOTOCARRIER LIFETIMES; SCANNING LASER BEAMS; SPATIAL MAPPING; SURFACE SCATTERING;

GERMANIUM;

GERMANIUM; NANOPARTICLE;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; DIFFUSION; LIGHT; MATERIALS TESTING; METHODOLOGY; RADIATION SCATTERING; ULTRASTRUCTURE;

COMPUTER SIMULATION; DIFFUSION; GERMANIUM; LIGHT; MATERIALS TESTING; MODELS, CHEMICAL; NANOPARTICLES; SCATTERING, RADIATION;

EID: 79953173936     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.006119     Document Type: Article

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