Electronic structure and magnetization correlations in Ni doped ZnO

Materials Letters

Volumn 65, Issue 10, 2011, Pages 1485-1487

  Singhal, R K ^a   Kumar, Sudhish ^b   Xing, Y T ^c   Deshpande, U P ^d   Shripathi, T ^d   Dolia, S N ^a   Saitovitch, E ^e  

^a UNIVERSITY OF RAJASTHAN   (India)

^b M L SUKHADIA UNIVERSITY   (India)

^c FLUMINENSE FEDERAL UNIVERSITY   (Brazil)

^d UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

^e CENTRO BRASILEIRO DE PESQUISAS FÍSICAS   (Brazil)

Author keywords

Magnetic materials; Semiconductors; X ray techniques

Indexed keywords

ANNEALED SAMPLES; EFFECT OF HYDROGEN; ELECTRONIC AND MAGNETIC PROPERTIES; ELECTRONIC CHANGES; FERROMAGNETIC STATE; IN-VACUUM; NI IONS; NI-DOPED; PARAMAGNETIC STATE; POST ANNEALING; SECONDARY PHASE; SEMICONDUCTORS; SQUID MEASUREMENTS; THREE ORDERS OF MAGNITUDE; VACUUM-ANNEALING; WURTZITE STRUCTURE; X-RAY TECHNIQUES; XPS;

ANNEALING; ELECTRONIC STRUCTURE; FERROMAGNETISM; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETIZATION; PARAMAGNETISM; RIETVELD METHOD; RIETVELD REFINEMENT; VACUUM; X RAY DIFFRACTION; X RAYS; ZINC OXIDE; ZINC SULFIDE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 79953167484     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2011.02.048     Document Type: Article

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