Effect of hydrogenation vs. re-heating on intrinsic magnetization of Co doped In 2 O 3

Applied Surface Science

Volumn 257, Issue 2, 2010, Pages 585-590

  Samariya, A ^a   Singhal, R K ^a,c   Kumar, Sudhish ^b   Xing, Y T ^c   Sharma, S C ^a   Kumari, P ^a   Jain, D C ^a   Dolia, S N ^a   Deshpande, U P ^d   Shripathi, T ^d   Saitovitch, E ^c  

^a UNIVERSITY OF RAJASTHAN   (India)

^b M L SUKHADIA UNIVERSITY   (India)

^c CENTRO BRASILEIRO DE PESQUISAS FÍSICAS   (Brazil)

^d UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

Author keywords

Magnetic semiconductors; X ray photoelectron spectroscopy

Indexed keywords

COBALT; ELECTRONIC PROPERTIES; FERROMAGNETISM; HYDROGENATION; INDIUM COMPOUNDS; MAGNETIC MOMENTS; MAGNETIC SEMICONDUCTORS; MAGNETIZATION; OXYGEN VACANCIES; PHOTOELECTRONS; PHOTONS; POINT DEFECTS; POLARONS; RIETVELD REFINEMENT; SEMICONDUCTOR DOPING; X RAY DIFFRACTION;

BIXBYITE STRUCTURE; BOUND MAGNETIC POLARONS; DOPANT IONS; DOPED SAMPLE; MAGNETIZATION MEASUREMENTS; PARASITIC PHASE; RE-HEATING; SINGLE PHASE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77956617928     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.07.037     Document Type: Article

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