ConSeq: Detecting concurrency bugs through sequential errors

International Conference on Architectural Support for Programming Languages and Operating Systems - ASPLOS

Volumn , Issue , 2011, Pages 251-264

  Zhang, Wei ^a   Lim, Junghee ^a   Olichandran, Ramya ^a   Scherpelz, Joel ^a   Jin, Guoliang ^a   Lu, Shan ^a   Reps, Thomas ^a,b  

^a University of Wisconsin Madison   (United States)

^b GRAMMATECH INC   (United States)

Author keywords

Concurrency bugs; Software testing

Indexed keywords

BUG DETECTION; CONCURRENCY BUGS; CONCURRENT PROGRAM; DATA DEPENDENCE; DATA RACES; DETECTION COVERAGE; INTERLEAVINGS; PROGRAM BINARY; REAL-WORLD; SEQUENTIAL ERROR; SHARED MEMORIES; SOFTWARE FAILURE; STATE-SPACE; STATIC SLICING; STRUCTURAL PATTERN; THREE PHASIS; TRADITIONAL TECHNIQUES;

COMPUTER SOFTWARE SELECTION AND EVALUATION; PROGRAM DEBUGGING; QUERY LANGUAGES; SOFTWARE TESTING;

CONCURRENCY CONTROL;

EID: 79953071157     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1950365.1950395     Document Type: Conference Paper

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