ConMem: Detecting severe concurrency bugs through an effect-oriented approach

International Conference on Architectural Support for Programming Languages and Operating Systems - ASPLOS

Volumn , Issue , 2010, Pages 179-191

  Zhang, Wei ^a   Sun, Chong ^a   Lu, Shan ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

Concurrency bugs; Software testing

Indexed keywords

CONCURRENCY BUGS; CONCURRENT PROGRAM; ERROR PROPAGATION; FALSE POSITIVE; FALSE POSITIVE RATES; HIGHLY-CORRELATED; INTERLEAVINGS; MEMORY ACCESS; MULTICORE TECHNOLOGY; OPEN-SOURCE PROGRAM; PRODUCTION RUN; PROGRAM EXECUTION; REAL-WORLD; SHARED MEMORIES;

COMPUTER OPERATING SYSTEMS; COMPUTER SOFTWARE SELECTION AND EVALUATION; LINGUISTICS; SOFTWARE TESTING;

PROGRAM DEBUGGING;

EID: 77952248433     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1736020.1736041     Document Type: Conference Paper

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