The use of a charge-coupled-device imaging system for X-ray film intensity measurement

Journal of Applied Crystallography

Volumn 29, Issue 2, 1996, Pages 105-109

  Grigg, M W ^a   Barnea, Z ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2842570377     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889894011878     Document Type: Article

References (4)

1. Grigg, M. W., Davis, T. J. & Barnea, Z. (1996). In preparation.
2. Henke, B. L., Uejio, J. Y., Stone, G. F., Dittmore, C. H. & Fujiwara, F. G. (1986). J. Opt. Soc. Am. B3, 1540.
3. Morimoto, H. & Uyeda. R. (1963). Acta Cryst. 16, 1107-1119.
4. Stone, G. F., Dittmore, C. H. & Henke, B. L. (1986). Rev. Sci. Instrum. 57, 2198.