메뉴 건너뛰기




Volumn 47, Issue 2, 2011, Pages 922-929

Analysis of PWM frequency control to improve the lifetime of PWM inverter

Author keywords

Tjcontrol; Adjustable speed drive (ASD); mean time to failure (MTTF); power cycling capability

Indexed keywords

ADJUSTABLE SPEED DRIVES; ADJUSTABLE-SPEED DRIVE (ASD); BOND WIRE; FREQUENCY CONTROL; FREQUENCY REDUCTION; INVERTER IGBT; JUNCTION TEMPERATURES; MEAN TIME TO FAILURE; MODULATION FREQUENCIES; POWER CYCLING; POWER CYCLING CAPABILITY; PULSEWIDTHS; PWM INVERTER;

EID: 79952953230     PISSN: 00939994     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIA.2010.2103391     Document Type: Article
Times cited : (148)

References (11)
  • 3
    • 3042769286 scopus 로고    scopus 로고
    • MTTF prediction and design of reliability tests for high power devices in automotive applications
    • Dec.
    • M. Ciappa, F. Carbognani, and W. Fichner, "MTTF prediction and design of reliability tests for high power devices in automotive applications," IEEE Trans. Device Mater. Rel., vol. 3, no. 4, pp. 191-196, Dec. 2003.
    • (2003) IEEE Trans. Device Mater. Rel. , vol.3 , Issue.4 , pp. 191-196
    • Ciappa, M.1    Carbognani, F.2    Fichner, W.3
  • 4
    • 0027814190 scopus 로고
    • Failure mechanism models for cyclic fatigue
    • Dec.
    • A. Dasgupta, "Failure mechanism models for cyclic fatigue," IEEE Trans. Rel., vol. 42, no. 4, pp. 548-555, Dec. 1993.
    • (1993) IEEE Trans. Rel. , vol.42 , Issue.4 , pp. 548-555
    • Dasgupta, A.1
  • 5
    • 0033732440 scopus 로고    scopus 로고
    • Lifetime prediction of IGBT modules for traction applications
    • San Jose, CA
    • M. Ciappa and W. Fichtner, "Lifetime prediction of IGBT modules for traction applications," in Proc. IEEE 38th Annu. Int. Rel. Phys. Symp., San Jose, CA, 2000, pp. 210-216.
    • (2000) Proc. IEEE 38th Annu. Int. Rel. Phys. Symp. , pp. 210-216
    • Ciappa, M.1    Fichtner, W.2
  • 6
    • 0030652545 scopus 로고    scopus 로고
    • Fast power cycling test for IGBT modules in traction application
    • Atlanta, GA
    • M. Held, P. Jacod, P. Scacco, and M. Poech, "Fast power cycling test for IGBT modules in traction application," in Conf. Rec. IEEE APEC, Atlanta, GA, 1997, pp. 425-430.
    • (1997) Conf. Rec. IEEE APEC , pp. 425-430
    • Held, M.1    Jacod, P.2    Scacco, P.3    Poech, M.4
  • 7
    • 3042769286 scopus 로고    scopus 로고
    • Lifetime prediction and design of reliability tests for high power devices in automotive applications
    • Dec.
    • M. Ciappa, F. Carbognani, and W. Fichtner, "Lifetime prediction and design of reliability tests for high power devices in automotive applications," IEEE Trans. Device Mater. Rel., vol. 3, no. 4, pp. 191-196, Dec. 2003.
    • (2003) IEEE Trans. Device Mater. Rel. , vol.3 , Issue.4 , pp. 191-196
    • Ciappa, M.1    Carbognani, F.2    Fichtner, W.3
  • 10
    • 0032761278 scopus 로고    scopus 로고
    • Simple analytical and graphical methods for carrier based PWM VSI drives
    • Jan.
    • A. M. Hava, R. J. Kerkman, and T. A. Lipo, "Simple analytical and graphical methods for carrier based PWM VSI drives," IEEE Trans. Power Electron., vol. 14, no. 1, pp. 49-61, Jan. 1999.
    • (1999) IEEE Trans. Power Electron. , vol.14 , Issue.1 , pp. 49-61
    • Hava, A.M.1    Kerkman, R.J.2    Lipo, T.A.3
  • 11
    • 68249137209 scopus 로고    scopus 로고
    • Evaluation of power cycling capabilities for adjustable speed drive
    • Edmonton, AB, Canada Oct.
    • L. Wei, R. J. Kerkman, and R. A. Lukaszewski, "Evaluation of power cycling capabilities for adjustable speed drive," in Conf. Rec. IEEE IAS Annu. Meeting, Edmonton, AB, Canada, Oct. 2008, pp. 1-10.
    • (2008) Conf. Rec. IEEE IAS Annu. Meeting , pp. 1-10
    • Wei, L.1    Kerkman, R.J.2    Lukaszewski, R.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.