118-DB dynamic range, continuous-time, opened-loop capactance to voltage converter readout for capacitive MEMS accelerometer

2010 IEEE Asian Solid-State Circuits Conference, A-SSCC 2010

Volumn , Issue , 2010, Pages 345-348

  Chai, Kevin T C ^a   Han, Dong ^a   Singh, Ravinder P ^a   Pham, Duy D ^a   Pang, Chin Y ^a   Luo, Jian W ^a   Nuttman, David ^b   Je, Minkyu ^a  

^a INSTITUTE OF MICROELECTRONICS   (Singapore)

^b Physical Logic Ltd   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ALLAN DEVIATION; ANALOG FRONT-END; BUILDING BLOCKES; CAPACITANCE-TO-VOLTAGE CONVERTERS; CONTINUOUS TIME; DYNAMIC RANGE; INTERFACE CIRCUITS; LONG TERM STABILITY; MEMS ACCELEROMETER; NOISE ANALYSIS; NOISE DENSITY; NON-LINEARITY; SIGNAL BANDWIDTH; VARIABLE GAIN AMPLIFIERS; VOLTAGE CONVERTER;

ACCELEROMETERS; CONTINUOUS TIME SYSTEMS; LOGIC CIRCUITS; LOW PASS FILTERS; VOLTAGE REGULATORS;

DIFFERENTIAL AMPLIFIERS;

EID: 79952833983     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASSCC.2010.5716626     Document Type: Conference Paper

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