Optical interference coatings 2010 measurement problem

Applied Optics

Volumn 50, Issue 9, 2011, Pages

  Duparré, Angela ^a   Ristau, Detlev ^b  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^b LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICS;

1064 NM; DIELECTRIC MIRRORS; MEASUREMENT PROBLEMS; OPTICAL INTERFERENCE COATINGS;

MOLECULAR PHYSICS;

EID: 79952803359     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.50.00C172     Document Type: Article

References (5)

1. A. Duparré and D. Ristau, "2004 Topical Meeting on Optical Interference Coatings: Measurement Problem," in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.
2. A. Duparré andD. Ristau, "Optical Interference Coatings 2007 Measurement Problem," Appl. Opt. 47, C179-C184 (2008).
3. S. Schröder, T. Herffurth, H. Blaschke, and A. Duparré, "Angle resolved scattering: an effective method for characterizing thin film coatings," Appl. Opt. 50, C164-C171 (2011).
4. A. Duparré, J. Ferre-Borull, S. Gliech, G. Notni, J. Steinert, and J. M. Bennett, "Surface characterization techniques for determining the rms roughness and power spectral densities of optical components," Appl. Opt. 41, 154-171 (2002). (Pubitemid 34636233)
5. "Optics and optical instruments-test methods for radiation scattered by optical components," ISO 13696:2002 (International Organization for Standardization, 2002).