Optical interference coatings 2007 measurement problem

Applied Optics

Volumn 47, Issue 13, 2008, Pages

  Duparré, Angela ^a   Ristau, Detlev ^b  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^b LASER ZENTRUM HANNOVER E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR PHYSICS; OPTICS;

ANGLE OF INCIDENCE; MEASUREMENT PROBLEMS; MEASUREMENTS OF; OPTICAL INTERFERENCE COATINGS; REFLECTANCE SPECTRUM; SINGLE OXIDES;

FUSED SILICA;

EID: 50849091630     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.00C179     Document Type: Article

References (2)

1. A. Duparréand D. Ristau, "2004 OIC Measurement Problem," in OIC Proceedings 2004 (Optical Society of America, 2004), paper WD 1.
2. ISO 13696:2002, "Optics and optical instruments: test methods for radiation scattered by optical components" (International Organization for Standardization, 2002).