In-situ TEM investigation of stepping motion of telescoping carbon nanotube

2010 IEEE/SICE International Symposium on System Integration: SI International 2010 - The 3rd Symposium on System Integration, SII 2010, Proceedings

Volumn , Issue , 2010, Pages 266-271

  Ode, Yasuhito ^a   Nakajima, Masahiro ^a   Yang, Zhan ^a   Saito, Yahachi ^a   Fukuda, Toshio ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL BREAKDOWN; IN-SITU TEM; IN-SITU TRANSMISSION; INNER CORE; NANO ELECTROMECHANICAL SYSTEMS; NANOACTUATORS; NANOMANIPULATIONS; OUTER SHELLS; PUSHING FORCES; STEPPING MOTION; TELESCOPING NANOTUBES;

CARBON NANOTUBES; TRANSMISSION ELECTRON MICROSCOPY;

INTEGRATION;

EID: 79952791713     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SII.2010.5708336     Document Type: Conference Paper

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