On the extended depth of focus algorithms for bright field microscopy

Micron

Volumn 32, Issue 6, 2001, Pages 559-569

  Valdecasas, A G ^a   Marshall, D ^b   Becerra, J M ^a   Terrero, J J ^a  

^a MUSEO NACIONAL DE CIENCIAS NATURALES   (Spain)

^b CARDIFF UNIVERSITY   (United Kingdom)

Author keywords

Bright field microscopy; Extended depth of focus; Image processing; Wavelets

Indexed keywords

ALGORITHM; ANIMAL; ARTICLE; HISTOLOGY; IMAGE PROCESSING; METHODOLOGY; MICROSCOPY; MITE;

ALGORITHMS; ANIMALS; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY; MITES;

EID: 0035093910     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(00)00061-5     Document Type: Article

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