Ductile-brittle transition in micropillar compression of GaAs at room temperature

Philosophical Magazine

Volumn 91, Issue 7-9, 2011, Pages 1190-1199

  Östlund, Fredrik ^a   Howie, Philip R ^b   Ghisleni, Rudy ^a   Korte, Sandra ^b   Leifer, Klaus ^c   Clegg, William J ^b   Michler, Johann ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b Department of Materials Science and Metallurgy   (United Kingdom)

^c UPPSALA UNIVERSITY   (Sweden)

Author keywords

compression test; fracture; GaAs; micropillar compression; scanning electron microscopy

Indexed keywords

COMPRESSION TESTS; COMPRESSIVE FAILURE; CRACK GROWTH; DUCTILE-BRITTLE TRANSITION; EXPERIMENTAL OBSERVATION; GAAS; MICRO-PILLARS; MICROPILLAR COMPRESSION; ROOM TEMPERATURE; SLIP PLANE;

COMPRESSION TESTING; CRACKS; GALLIUM ALLOYS; GALLIUM ARSENIDE; MATERIALS TESTING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM;

FRACTURE;

EID: 79952676336     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786435.2010.509286     Document Type: Article

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