Application of fast sensors to microscope mode spatial imaging mass spectrometry

Journal of Instrumentation

Volumn 6, Issue 1, 2011, Pages

  Brouard, M ^a   Johnsen, A J ^a   Nomerotski, A ^b   Slater, C S ^a   Vallance, C ^a   Yuen, W H ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b Denys Wilkinson Building ^*  (United Kingdom)

Author keywords

Instrumentation and methods for time of flight (TOF) spectroscopy; Mass spectrometers; Pixelated detectors and associated VLSI electronics

Indexed keywords

EID: 79952656462     PISSN: 17480221     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/6/01/C01044     Document Type: Conference Paper

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