Pixel Imaging Mass Spectrometry with fast and intelligent Pixel detectors

Journal of Instrumentation

Volumn 5, Issue 7, 2010, Pages

  Nomerotski, A ^a   Brouard, M ^a   Campbell, E ^a   Clark, A ^b   Crooks, J ^b   Fopma, J ^a   John, J J ^a   Johnsen, A J ^a   Slater, C ^a   Turchetta, R ^b   Vallance, C ^a   Wilman, E ^a   Yuen, W H ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Instrumentation and methods for time of flight (TOF) spectroscopy; Ion identification systems; Mass spectrometers; VLSI circuits

Indexed keywords

COMPLEX ORGANIC MOLECULES; IMAGING MASS SPECTROMETRY; ION IDENTIFICATIONS; ION VELOCITY DISTRIBUTION; SPATIAL INFORMATIONS; STRUCTURAL INFORMATION; TIME OF FLIGHT; TOF MASS SPECTROMETRY;

CMOS INTEGRATED CIRCUITS; MASS SPECTROMETERS; PIXELS; SECONDARY ION MASS SPECTROMETRY; VLSI CIRCUITS;

IONS;

EID: 78349244036     PISSN: 17480221     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/5/07/C07007     Document Type: Conference Paper

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