Optical properties of gold island films-a spectroscopic ellipsometry study

Thin Solid Films

Volumn 519, Issue 9, 2011, Pages 2946-2950

  Lončarić, Martin ^a   Sancho Parramon, Jordi ^a   Zorc, Hrvoje ^a  

^a RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

Metal islands; Optical properties; Spectroscopic ellipsometry; Surface plasmon

Indexed keywords

ANGLES OF INCIDENCE; DEPOSITION ON GLASS; DIFFERENT MASS; DIFFERENT SUBSTRATES; ELLIPSOMETRIC DATA; EVAPORATION PROCESS; FREE ELECTRON; GLASS SUBSTRATES; GOLD ISLANDS; ISLAND FILMS; LOCALIZED SURFACE PLASMON RESONANCE; METAL ISLAND FILMS; METAL ISLANDS; METAL NANOPARTICLES; NOBLE METALS; NORMAL INCIDENCE; OPTICAL CHARACTERIZATION; SUPPORTED METALS; SURFACE PLASMON; TRANSMITTANCE MEASUREMENTS;

GLASS; GOLD COATINGS; GOLD DEPOSITS; METALS; NANOPARTICLES; OPTICAL CONSTANTS; OPTICAL PROPERTIES; PLASMONS; PRECIOUS METALS; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; SURFACE PLASMON RESONANCE;

OPTICAL FILMS;

EID: 79952630536     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.12.068     Document Type: Article

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