Optical and structural characterization of silver islands films on glass substrates

Vacuum

Volumn 84, Issue 1, 2009, Pages 188-192

  Loncaric M ^a   Sancho Parramon, J ^a   Pavlovic M ^a   Zorc, H ^a   Dubcek P ^a   Turkovic A ^a   Bernstorff, S ^b   Jakopic, G ^c   Haase, A ^c  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b SINCROTRONE TRIESTE   (Italy)

^c Institute of Nanostructured Materials and Photonics   (Austria)

Author keywords

Optical properties; Silver islands; Surface plasmon

Indexed keywords

ABSORPTION PEAKS; ABSORPTION PROPERTY; BLUE SHIFT; DEPOSITION TEMPERATURES; DEPOSITION THICKNESS; E BEAM EVAPORATION; FABRICATION PARAMETERS; GLASS SUBSTRATES; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; MASS THICKNESS; METAL ISLAND FILMS; OPTICAL CHARACTERIZATION; RED SHIFT; SHAPE AND SIZE; SILVER ISLANDS; STRUCTURAL CHARACTERIZATION; SUBSTRATE TEMPERATURE; SURFACE PLASMON; SURFACE PLASMONS;

ABSORPTION; ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; GLASS; LIGHT TRANSMISSION; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; PLASMONS; SUBSTRATES; X RAY SCATTERING;

SILVER;

EID: 69249216475     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2009.04.014     Document Type: Article

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