Surface studies of halloysite nanotubes by XPS and ToF-SIMS

Surface and Interface Analysis

Volumn 43, Issue 4, 2011, Pages 795-802

  Ng, Kai Mo ^a   Lau, Yiu Ting R ^a   Chan, Chi Ming ^a   Weng, Lu Tao ^a   Wu, Jingshen ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

halloysite; PCA; ToF SIMS; XPS

Indexed keywords

ALKALI METAL SALTS; BENZALKONIUM CHLORIDE; CLUSTER ION BEAMS; GEOGRAPHIC AREAS; GEOGRAPHICAL LOCATIONS; HALLOYSITE; HALLOYSITE NANOTUBES; INORGANIC SALTS; ION YIELDS; MORPHOLOGICAL DIVERSITY; PCA; STATIC TOF-SIMS; SURFACE CHARACTERIZATION; SURFACE STUDY; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS; TUBULAR STRUCTURES; XPS;

ALKALI METALS; CHEMICALS REMOVAL (WATER TREATMENT); CHLORINE COMPOUNDS; HYDROGEN PEROXIDE; ION BEAMS; IONS; KAOLINITE; NANOTUBES; SECONDARY ION MASS SPECTROMETRY; SURFACE ANALYSIS; SURFACE PROPERTIES; THERMOGRAVIMETRIC ANALYSIS; TUBULAR STEEL STRUCTURES; X RAY PHOTOELECTRON SPECTROSCOPY;

PRINCIPAL COMPONENT ANALYSIS;

EID: 79952568195     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3627     Document Type: Article

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