Roughness characterization of well-polished surfaces by measurements of light scattering distribution

Optica Applicata

Volumn 40, Issue 4, 2010, Pages 811-818

  Zhenrong, Zheng ^a   Jing, Zhou ^a   Peifu, Gu ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Bidirectional reflectance distribution function (BRDF); Light scattering; Roughness

Indexed keywords

APPLICATION PROSPECT; BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTIONS; BRDF (BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION); LIGHT SCATTERING DISTRIBUTIONS; LIGHT SCATTERING MEASUREMENT; NON-DESTRUCTIVE MEASUREMENT; POLISHED SURFACES; ROOT MEAN SQUARE; ROUGH SURFACES; ROUGHNESS; SCALAR SCATTERING; SCANNING METHODS; SILICA SURFACE; STATISTICAL CHARACTERIZATION; TOTAL INTEGRATED SCATTERINGS;

ARTIFICIAL INTELLIGENCE; LIGHT SCATTERING; MEASUREMENT THEORY; NONDESTRUCTIVE EXAMINATION; POWER SPECTRAL DENSITY; REFLECTION; REFRACTION; SCATTERING; SILICA; SURFACE ROUGHNESS;

DISTRIBUTION FUNCTIONS;

EID: 79951940692     PISSN: 00785466     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

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