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Volumn , Issue , 2010, Pages 562-565

Piezoresistive response of five-contact vertical hall devices

Author keywords

[No Author keywords available]

Indexed keywords

FOUR-POINT BENDING; HALL DEVICES; IN-PLANE STRESS; JUNCTION FIELD EFFECTS; MECHANICAL STRESS; PIEZO-RESISTIVE; PIEZORESISTIVE EFFECTS; SENSOR GEOMETRIES; SENSOR SYSTEMS; SINGLE SENSOR; STRESS DISTRIBUTION; STRESS SENSITIVITY; VERTICAL FORCE; VERTICAL HALL SENSORS;

EID: 79951905349     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2010.5690477     Document Type: Conference Paper
Times cited : (4)

References (8)
  • 1
    • 0021483872 scopus 로고
    • The vertical Hall effect device
    • R. S. Popovic, "The vertical Hall effect device", IEEE Electron Device Lett., vol. 5, pp. 357-358, 1984.
    • (1984) IEEE Electron Device Lett , vol.5 , pp. 357-358
    • Popovic, R.S.1
  • 3
    • 84944750946 scopus 로고    scopus 로고
    • Quasi-analytical study of offset voltage due to piezoresistive effect in vertical Hall devices by mapping techniques
    • Boston, USA
    • R. Sunier, "Quasi-analytical study of offset voltage due to piezoresistive effect in vertical Hall devices by mapping techniques", Dig. Tech. papers Transducers, Boston, USA, pp. 1582-1584, 2003.
    • (2003) Dig. Tech. Papers Transducers , pp. 1582-1584
    • Sunier, R.1
  • 4
    • 30344439142 scopus 로고    scopus 로고
    • The influence of package-induced stresses on moulded Hall sensors
    • S. Fischer, "The influence of package-induced stresses on moulded Hall sensors", Microsyst. Technol., vol. 12, pp. 69-74, 2005.
    • (2005) Microsyst. Technol. , vol.12 , pp. 69-74
    • Fischer, S.1
  • 5
    • 79951874979 scopus 로고    scopus 로고
    • Vertical Hall sensor
    • German and european patent, no. PCT/DE2002/003901
    • H. -P. H. M. Hackner, and R. Ernst, "Vertical Hall sensor", German and european patent, no. PCT/DE2002/003901, 2001.
    • (2001)
    • Hackner, H.P.H.M.1    Ernst, R.2
  • 7
    • 42949151484 scopus 로고    scopus 로고
    • Four point bending setup for characterization of semiconductor piezoresistance
    • 10 pages
    • J. Richter, M. B. Arnoldus, O. Hansen, and E. V. Thomsen, "Four point bending setup for characterization of semiconductor piezoresistance", Rev. Sci. Instrum., vol. 79, no. 4, pp. 44703 (10 pages), 2008.
    • (2008) Rev. Sci. Instrum. , vol.79 , Issue.4 , pp. 44703
    • Richter, J.1    Arnoldus, M.B.2    Hansen, O.3    Thomsen, E.V.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.