Quasi-analytical study of offset voltage due to piezoresistive effect in vertical Hall devices by mapping techniques

TRANSDUCERS 2003 - 12th International Conference on Solid-State Sensors, Actuators and Microsystems, Digest of Technical Papers

Volumn 2, Issue , 2003, Pages 1582-1585

  Sunier, R ^a   Taschini, S ^a   Brand, O ^b   Vancura, T ^a   Baltes, H ^a  

^a ETH ZURICH   (Switzerland)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Application software; Conformal mapping; Current density; Electric potential; Laboratories; Performance analysis; Physics computing; Piezoresistance; Spinning; Voltage

Indexed keywords

ACTUATORS; APPLICATION PROGRAMS; CONFORMAL MAPPING; CURRENT DENSITY; ELECTRIC POTENTIAL; HALL EFFECT DEVICES; HALL EFFECT TRANSDUCERS; LABORATORIES; MAPPING; METAL SPINNING; MICROSYSTEMS; TRANSDUCERS;

AFFINE TRANSFORMATIONS; ANALYTICAL STUDIES; MAPPING TECHNIQUES; PERFORMANCE ANALYSIS; PIEZORESISTANCE; PIEZORESISTIVE EFFECTS; VERTICAL BOUNDARIES; VERTICAL HALL SENSORS;

SOLID-STATE SENSORS;

EID: 84944750946     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2003.1217082     Document Type: Conference Paper

References (6)

1. S. Bellekom, Origins of offset in conventional and spinning-current Hall plates, Delft University Press, 1998.
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4. S. Kukase et al., Proc. of IEEE, 67(1979) 171-172.
5. H. Shibata et al., Electronic Letters, 19 (1983) 518-519.
6. P.A. Besse et al., Proc. of MSM'98, p.660-5, 1998.