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Volumn 22, Issue 3, 2011, Pages

Uncertainty evaluation for three-dimensional scanning electron microscope reconstructions based on the stereo-pair technique

Author keywords

Measurement uncertainty; Multiple view strategy; SEM; Stereo pair technique; Surface reconstruction; Wire gauge

Indexed keywords

GAGES; REPAIR; ROTATION; SCANNING ELECTRON MICROSCOPY; SURFACE RECONSTRUCTION; UNCERTAINTY ANALYSIS;

EID: 79951873317     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/3/035103     Document Type: Article
Times cited : (37)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.