-
3
-
-
14944374763
-
Investigation on the traceability of three dimensional scanning electron microscope measurements based on the stereo-pair technique
-
DOI 10.1016/j.precisioneng.2004.08.002, PII S0141635904001321
-
Bariani P, De Chiffre L, Hansen H N and Horsewell A 2005 Investigation on the traceability of three-dimensional scanning electron microscope measureme (Pubitemid 40370715)
-
(2005)
Precision Engineering
, vol.29
, Issue.2
, pp. 219-228
-
-
Bariani, P.1
De Chiffre, L.2
Hansen, H.N.3
Horsewell, A.4
-
4
-
-
0015809208
-
Quantitative photogrammetric analysis and qualitative stereoscopic analysis of SEM images
-
Boyde A 1973 Quantitative photogrammetric analysis and qualitative stereoscopic analysis of SEM images J. Microsc. 98 452-71
-
(1973)
J. Microsc
, vol.98
, pp. 452-471
-
-
Boyde, A.1
-
6
-
-
79951920737
-
Improvement of geometrical measurements from 3D-SEM reconstructions
-
Carli L, De Chiffre L, Horsewell A, Carmignato S, Caroli M and Santin D 2009 Improvement of geometrical measurements from 3D-SEM reconstructions Proc. 11th CIRP Int. Conf. on Computer Aided Tolerancing pp 1-7
-
(2009)
Proc. 11th CIRP Int. Conf. on Computer Aided Tolerancing
, pp. 1-7
-
-
Carli, L.1
De Chiffre, L.2
Horsewell, A.3
Carmignato, S.4
Caroli, M.5
Santin, D.6
-
7
-
-
79951899665
-
Experimental investigation on the influence of instrument settings on pixel size and nonlinearity in SEM image formation
-
Carli L, Genta G, Cantatore A, Barbato G, De Chiffre L and Levi R 2010 Experimental investigation on the influence of instrument settings on pixel size and nonlinearity in SEM image formation Proc. 10th EUSPEN Int. Conf. pp 192-5
-
(2010)
Proc. 10th EUSPEN Int. Conf.
, pp. 192-195
-
-
Carli, L.1
Genta, G.2
Cantatore, A.3
Barbato, G.4
De Chiffre, L.5
Levi, R.6
-
11
-
-
73149112098
-
Rauheitsmessung mit dem Raster-Elektronenmikroskop (REM)
-
German
-
Hillmann W 1980 Rauheitsmessung mit dem Raster-Elektronenmikroskop (REM) Tech. Mess. tm 9116 6 (in German)
-
(1980)
Tech. Mess. Tm
, vol.9116
, pp. 6
-
-
Hillmann, W.1
-
12
-
-
0009212347
-
-
ISO, Guide to the estimation of uncertainty in GPS measurement, in calibration of measuring equipment and in product verification ISO 14253-2:1999, International Organization for Standardization
-
ISO 1999 Geometrical product specifications (GPS)-inspection by measurement of workpieces and measuring equipment-part 2. Guide to the estimation of uncertainty in GPS measurement, in calibration of measuring equipment and in product verification ISO 14253-2:1999, International Organization for Standardization
-
(1999)
Geometrical Product Specifications (GPS)-inspection by Measurement of Workpieces and Measuring Equipment-part 2
-
-
-
13
-
-
0012941136
-
-
ISO, Determination of accuracy and repeatability of positioning numerically controlled axes ISO 230-2:2006, International Organization for Standardization
-
ISO 2006 Test code for machine tools-part 2. Determination of accuracy and repeatability of positioning numerically controlled axes ISO 230-2:2006, International Organization for Standardization
-
(2006)
Test Code for Machine Tools-part 2
-
-
-
17
-
-
0000119246
-
A contribution to stereo-photogrammetry with the scanning electron microscope
-
Kolednik O 1981 A contribution to stereo-photogrammetry with the scanning electron microscope Prakt. Metallogr. 18 562-73
-
(1981)
Prakt. Metallogr
, vol.18
, pp. 562-573
-
-
Kolednik, O.1
-
18
-
-
46749152245
-
Critical factors in SEM 3D stereo microscopy
-
Marinello F, Bariani P, Savio E, Horsewell A and De Chiffre L 2008b Critical factors in SEM 3D stereo microscopy Meas. Sci. Technol. 19 065705
-
(2008)
Meas. Sci. Technol.
, vol.19
, pp. 065705
-
-
Marinello, F.1
Bariani, P.2
Savio, E.3
Horsewell, A.4
De Chiffre, L.5
-
19
-
-
84872547463
-
Metrological performance of SEM 3D techniques
-
Marinello F, Carmignato S, Savio E, Bariani P, Carli L, Horsewell A and De Chiffre L 2008a Metrological performance of SEM 3D techniques Proc. 18th IMEKO TC 2 Symp. on Photonics in Measurements pp 1-6
-
(2008)
Proc. 18th IMEKO TC 2 Symp. on Photonics in Measurements
, pp. 1-6
-
-
Marinello, F.1
Carmignato, S.2
Savio, E.3
Bariani, P.4
Carli, L.5
Horsewell, A.6
De Chiffre, L.7
-
20
-
-
0015703989
-
Photogrammetry with the scanning electron microscope
-
Piazzesi G 1973 Photogrammetry with the scanning electron microscope J. Phys. E: Sci. Instrum. 6 392-6
-
(1973)
J. Phys. E: Sci. Instrum.
, vol.6
, pp. 392-396
-
-
Piazzesi, G.1
-
21
-
-
0024983556
-
Way to measurement for sub-micron meter. Surface profile by scanning electron microscope
-
Sato H 1990 A way to measurement for submicron meter: surface profile by scanning electron microscope Proc. Manufacturing International pp 63-73 (Pubitemid 20727678)
-
(1990)
Proc Manuf Int 90 Part 3 Int Aspects Manuf
, pp. 63-73
-
-
Sato, H.1
-
22
-
-
0036537472
-
A taxonomy and evaluation of dense two-frame stereo correspondence algorithms
-
DOI 10.1023/A:1014573219977
-
Scharstein D and Szeliski R 2002 A taxonomy and evaluation of dense two-frame stereo correspondence algorithms Int. J. Comput. Vision. 47 7-42 (Pubitemid 34428419)
-
(2002)
International Journal of Computer Vision
, vol.47
, Issue.1-3
, pp. 7-42
-
-
Scharstein, D.1
Szeliski, R.2
-
23
-
-
14944338823
-
3D surface analysis in scanning electron microscopy
-
Scherer S 2002 3D surface analysis in scanning electron microscopy G. I. T. Imaging and Microscopy 3 45-6
-
(2002)
G. I. T. Imaging and Microscopy
, vol.3
, pp. 45-46
-
-
Scherer, S.1
-
24
-
-
0030130416
-
Determination of the height of a microstructure sample by a SEM with a conventional and a digital photogrammetric method
-
DOI 10.1016/0304-3991(96)00028-9
-
Schubert M, Gleichmann A, Hemmleb M, Albertz J and Köhler J M 1996 Determination of the height of a microstructure sample by a SEM with a conventional and a digital photogrammetric method Ultramicroscopy 63 57-64 (Pubitemid 26273669)
-
(1996)
Ultramicroscopy
, vol.63
, Issue.1
, pp. 57-64
-
-
Schubert, M.1
Gleichmann, A.2
Hemmleb, M.3
Albertz, J.4
Kohler, J.M.5
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