메뉴 건너뛰기




Volumn , Issue , 2010, Pages

10 μm pixel-to-pixel pitch hybrid backside illuminated AlGaN-on-Si imagers for solar blind EUV radiation detection

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; AL-CONCENTRATION; ALGAN; BACKSIDE-ILLUMINATED; DEEP UV; EUV RADIATION; EXTREME ULTRAVIOLETS; EXTREME UV; IMAGERS; MEASUREMENT RESULTS; PIXEL PITCH; RADIATION HARDNESS; SI-BASED; SOLAR BLIND;

EID: 79951834995     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2010.5703362     Document Type: Conference Paper
Times cited : (13)

References (4)
  • 1
    • 70349694304 scopus 로고    scopus 로고
    • Radiation damage resistance of AlGaN detectors for applications in the extreme-ultraviolet spectral range
    • F. Barkusky, C. Peth, A. Bayer, K. Mann, J. John and P.E. Malinowski, "Radiation damage resistance of AlGaN detectors for applications in the extreme-ultraviolet spectral range", Rev. Sci. Instrum. 80, 093102, 2009.
    • (2009) Rev. Sci. Instrum. , vol.80 , pp. 093102
    • Barkusky, F.1    Peth, C.2    Bayer, A.3    Mann, K.4    John, J.5    Malinowski, P.E.6
  • 2
    • 0038035067 scopus 로고    scopus 로고
    • Short-wavelength solar-blind detectors-status, prospects, and markets
    • M. Razeghi, "Short-wavelength solar-blind detectors-status, prospects, and markets", Proc. IEEE, Vol. 90, No. 6, 2002.
    • (2002) Proc. IEEE , vol.90 , Issue.6
    • Razeghi, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.