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Volumn , Issue , 2010, Pages
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10 μm pixel-to-pixel pitch hybrid backside illuminated AlGaN-on-Si imagers for solar blind EUV radiation detection
a,b c a a a a,b a a a c c d d d a,b a,b
c
CRHEA CNRS
(France)
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVE LAYER;
AL-CONCENTRATION;
ALGAN;
BACKSIDE-ILLUMINATED;
DEEP UV;
EUV RADIATION;
EXTREME ULTRAVIOLETS;
EXTREME UV;
IMAGERS;
MEASUREMENT RESULTS;
PIXEL PITCH;
RADIATION HARDNESS;
SI-BASED;
SOLAR BLIND;
ELECTRON DEVICES;
SILICON;
SYNCHROTRON RADIATION;
PIXELS;
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EID: 79951834995
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IEDM.2010.5703362 Document Type: Conference Paper |
Times cited : (13)
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References (4)
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