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Volumn 257, Issue 11, 2011, Pages 4863-4866

The characterization of Cr secondary oxide phases in ZnO films studied by X-ray spectroscopy and photoemission spectroscopy

Author keywords

Secondary oxide phases; Spinel structure; X ray absorption spectroscopy; X ray emission spectroscopy; X ray photoemission spectroscopy

Indexed keywords

ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; II-VI SEMICONDUCTORS; METALLIC FILMS; OXIDE FILMS; SPUTTERING; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY ABSORPTION SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SCATTERING; ZINC OXIDE;

EID: 79951672867     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.12.125     Document Type: Article
Times cited : (7)

References (28)
  • 2
    • 0032516694 scopus 로고    scopus 로고
    • H. Ohno Science 281 1998 951
    • (1998) Science , vol.281 , pp. 951
    • Ohno, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.