Diameter dependence of the electronic structure of ZnO nanorods determined by x-ray absorption spectroscopy and scanning photoelectron microscopy

Applied Physics Letters

Volumn 85, Issue 15, 2004, Pages 3220-3222

  Chiou, J W ^a   Kumar, K P Krishna ^a   Jan, J C ^a   Tsai, H M ^a   Bao, C W ^a   Pong, W F ^a   Chien, F Z ^a   Tsai, M H ^b   Hong, I H ^c,e   Klauser, R ^c   Lee, J F ^c   Wu, J J ^d   Liu, S C ^d  

^a TAMKANG UNIVERSITY   (Taiwan)

^b NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^d NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^e NATIONAL CHIAYI UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRONIC STRUCTURE; NANOSTRUCTURED MATERIALS; SCANNING; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

DIAMETER DEPENDENCE; NANORODS; REFERENCE FILMS; VALENCE BAND;

ZINC OXIDE;

EID: 8644265192     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1802373     Document Type: Article

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