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Materials Chemistry and Physics

Volumn 126, Issue 3, 2011, Pages 568-572

A Raman spectroscopic study of structural evolution of electrochemically deposited ZnO films with deposition time

(3) Tripathi, Neeti a Vijayarangamuthu, K a Rath, Shyama a

a UNIVERSITY OF DELHI (India)

Author keywords

Crystallite size; Raman spectroscopy; Spatial correlation model; X ray diffraction

Indexed keywords

AQUEOUS SOLUTIONS; CORRELATION LENGTHS; CRYSTALLINITIES; DEGREE OF DISORDER; DEPOSITION TIME; ELECTRODEPOSITION METHODS; HEXAGONAL WURTZITE STRUCTURE; INTENSITY RATIO; OPTIMUM DEPOSITION; OXYGEN DEFICIENCY; POLYCRYSTALLINE ZNO; RAMAN SPECTRA; RAMAN SPECTROSCOPIC STUDY; ROOM TEMPERATURE; SPATIAL CORRELATION MODEL; SPATIAL CORRELATION MODELS; STRUCTURAL EVOLUTION; X-RAY DIFFRACTION MEASUREMENTS; ZINC NITRATES; ZINC OXIDE THIN FILMS; ZNO FILMS;

DIFFRACTION; ELECTRODEPOSITION; METALLIC FILMS; OXIDE FILMS; OXYGEN; PHONONS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS; ZINC; ZINC OXIDE; ZINC SULFIDE;

CRYSTALLITE SIZE;

EID: 79951634591 PISSN: 02540584 EISSN: None Source Type: Journal
DOI: 10.1016/j.matchemphys.2011.01.026 Document Type: Article

Times cited : (42)

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