Interaction stress measurement using atomic force microscopy: A stepwise discretization method

Journal of Physical Chemistry C

Volumn 114, Issue 35, 2010, Pages 15029-15035

  Rahmat, Meysam ^a   Hubert, Pascal ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; CURRENT INTERACTIONS; DISCRETIZATION METHOD; EVALUATING CRITERIA; EXPERIMENTAL PROCEDURE; FORCE CURVE; HAMAKER CONSTANTS; INTERACTION ENERGIES; INTERACTION FORCES; INTERACTION MECHANISMS; INTERNAL STRESS; MEASUREMENT PARAMETERS;

ATOMIC FORCE MICROSCOPY; DISCRETE EVENT SIMULATION; EXPERIMENTS; VOLUME MEASUREMENT;

STRESS MEASUREMENT;

EID: 79951591610     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp104993f     Document Type: Article

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