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Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science
Volumn 42, Issue 3, 2011, Pages 636-644
Quantitative atomic force microscopy characterization and crystal plasticity finite element modeling of heterogeneous deformation in commercial purity titanium
Author keywords

[No Author keywords available]
Indexed keywords

AFM; BACKSCATTERED ELECTRON IMAGING; COMMERCIAL PURITY TITANIUM; CRYSTAL PLASTICITY FINITE ELEMENT; DEFORMATION PROCESS; DISLOCATION SLIP; ELECTRON BACK-SCATTERED DIFFRACTION; EXPERIMENTAL OBSERVATION; FOUR-POINT BEND; HETEROGENEOUS DEFORMATION; MICRO-STRUCTURAL; PHENOMENOLOGICAL MODELS; SHEAR DISTRIBUTIONS; SURFACE STRAINS;
EID: 79951508467     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-010-0475-0     Document Type: Conference Paper
Times cited : (64)
References (27)
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