Activation of dislocation sources in γ-phases of nickel-base superalloys studied by use of atomic-force microscopy and transmission electron microscopy

Materials Science and Engineering: A

Volumn 387-389, Issue 1-2 SPEC. ISS., 2004, Pages 103-108

  Pettinari Sturmel, Florence ^a   Coupeau, C ^b   Clement N ^a   Coujou, A ^a  

^a CEMES CNRS   (France)

^b UNIVERSITÉ DE POITIERS   (France)

Author keywords

Dislocation source; Friction stress; Short range order

Indexed keywords

BAND STRUCTURE; FRICTION; NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY; STRESSES; SUPERALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

DISLOCATION MOVEMENT; NICKEL-BASE SUPERALLOYS; SHORT-RANGE ORDER; SLIP BANDS;

DISLOCATIONS (CRYSTALS);

ALLOY;

EID: 10444280723     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2004.02.084     Document Type: Article

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