Intrinsic optical properties of vanadium dioxide near the insulator-metal transition

Nano Letters

Volumn 11, Issue 2, 2011, Pages 466-470

  Liu, Wei Tao ^a   Cao, J ^a   Fan, W ^b   Hao, Zhao ^c   Martin, Michael C ^c   Shen, Y R ^a   Wu, J ^a   Wang, F ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

correlated electron nanomaterials; infrared microspectroscopy; insulator metal transition; phase transition; Vanadium dioxide

Indexed keywords

ABRUPT TRANSITION; INFRARED MICRO-SPECTROSCOPY; INFRARED RESPONSE; INSULATING BANDS; INSULATOR METAL TRANSITION; INTRINSIC BEHAVIOR; INTRINSIC OPTICAL PROPERTIES; METALLIC PHASIS; MICRO BEAMS; NANO-MATERIALS; PEIERLS TRANSITION; SINGLE DOMAINS; SINGLE-CRYSTALLINE; TEMPERATURE-INDUCED; VANADIUM DIOXIDE;

ENERGY GAP; METALS; MICROOPTICS; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; SEMICONDUCTOR INSULATOR BOUNDARIES; VANADIUM; VANADIUM ALLOYS;

METAL INSULATOR TRANSITION;

NANOMATERIAL; OXIDE; VANADIUM;

ARTICLE; CHEMISTRY; CONFORMATION; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; LIGHT; MACROMOLECULE; MATERIALS TESTING; PARTICLE SIZE; RADIATION SCATTERING; SEMICONDUCTOR; SURFACE PROPERTY; ULTRASTRUCTURE;

ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; LIGHT; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; OXIDES; PARTICLE SIZE; SCATTERING, RADIATION; SEMICONDUCTORS; SURFACE PROPERTIES; VANADIUM;

EID: 79851500702     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl1032205     Document Type: Article

References (32)

1. Dagotto, E. Science 2005, 309, 257-262
2. Dagotto, E.; Hotta, T.; Moreo, A. Phys. Rep. 2001, 344, 1-153
3. Dagotto, E. Nanoscale Phase Separation and Colossal Magnetoresistance; Springer-Verlag: Berlin, 2002.
4. Morin, F. J. Phys. Rev. Lett. 1959, 3, 34-36
5. Wentzcovitch, R. M.; Schulz, W. W.; Allen, P. B. Phys. Rev. Lett. 1994, 72, 3389-3392
6. Booth, J. M.; Casey, P. S. Phys. Rev. Lett. 2009, 103 086402
7. Qazilbash, M. M. Science 2007, 318, 1750-1753
8. Qazilbash, M. M. Phys. Rev. B 2009, 79 075107
9. Wu, J. Q.; Gu, Q.; Guiton, B. S.; de Leon, N. P.; Ouyang, L.; Park, H. Nano Lett. 2006, 6, 2313-2317
10. Guiton, B. S.; Gu, Q.; Prieto, A. L.; Gudiksen, M. S.; Park, H. J. Am. Chem. Soc. 2005, 127, 498-499
11. Wei, J.; Wang, Z.; Chen, W.; Cobden, D. H. Nat. Nanotechnol. 2009, 4, 420-424
12. Jones, A. C.; Berweger, S.; Wei, J.; Cobden, D. H; Raschke, M. B. Nano Lett. 2010, 10, 1574-1581
13. Zhang, S.; Chou, J. Y.; Lauhon, L. J. Nano Lett. 2009, 9, 4527-4532
14. Biermann, S.; Poteryaev, A.; Lichtenstein, A. I.; Georges, A. Phys. Rev. Lett. 2005, 94 026404
15. Tomczak, J. M.; Aryasetiawan, F.; Biermann, S. Phys. Rev. B 2008, 78 115103
16. Cao, J. Nat. Nanotechnol. 2009, 4, 732-737
17. Rini, M. Appl. Phys. Lett. 2008, 92 181904
18. Barker, A. S., Jr.; Verleur, H. W.; Guggenheim, H. J. Phys. Rev. Lett. 1966, 17, 1286-1289
19. Abdulhalim, I. J. Opt. A 1999, 1, 655-661
20. Humecki, H. J. Practical Guide to Infrared Microspectroscopy; Marcel Dekker: New York, 1995; Chapter 1.
21. Levenson, E.; Lerch, P.; Martin, M. C. Infrared Phys. Technol. 2008, 51, 413-416
22. Eyert, V. Ann. Phys. 2002, 15, 650-702
23. Cao, J.; Gu, Y.; Fan, W.; Chen, L. Q.; Ogletree, D. F.; Chen, K.; Tamura, N.; Kunz, M.; Barrett, C.; Seidel, J.; Wu, J. Nano Lett. 2010, 10, 2667-2673
24. Ladd, L. A.; Paul, W. Solid State Commun. 1969, 7, 425-428
25. Okazaki, K.; Fujimori, A.; Onoda, M. J. Phys. Soc. Jpn. 2002, 71, 822-825
26. Ünlü, H. Solid-State Electron. 1992, 35, 1343-1352
27. Kucharczyk, D.; Niklewski, T. J. Appl. Crystallogr. 1979, 12, 370-373
28. Novikova, S. I. Sov. Phys. Solid State 1969, 2, 37-38
29. Jain, S. C.; Roulston, D. J. Solid-State Electron. 1991, 34, 453-465
30. Ruzmetov, D. Phys. Rev. B 2009, 79 153107
31. Cao, J. Phys. Rev. B 2010, 82 241101(R)
32. Zylbersztejn, A.; Mott, N. F. Phys. Rev. B 1975, 11, 4383-4395